data brief for further information contact your local stmicroelectronics sales office. december 2011 doc id 022631 rev 1 1/4 4 STEVAL-IFP010V3 high-side driver based on the vni2140j features output current: 1 a per channel shorted-load protection junction overtemperature protection case overtemperature protection for thermal independence of the channels non-simultaneous tcsd (thermal case shutdown) restart for the various channels protection against loss of ground current limitation undervoltage shutdown open load in off-state and short to v cc detection open-drain diagnostic outputs 3.3 v cmos/ttl compatible inputs fast demagnetization of inductive loads conforms to iec 61131-2 supply voltage: +4 v to +36 v rohs compliant description the STEVAL-IFP010V3 demonstration board is based on the vni2140j, a monolithic device designed using st?s vipower technology for driving two independent resistive or inductive loads with one side connected to ground. active current limitation prevents a drop in system power supply if the load is shorted. a built-in thermal shutdown protects the chip from overtemperature and short-circuit conditions. during an overload condition, the channel turns off and back on automatically in order to maintain the junction temperature between ttsd and tr. if this condition causes the case temperature to reach tcsd, the overloaded channel is turned off and will restart only when the case temperature has decreased down to tcr. if more than one channel is in overload, the tcsd restart will not be simultaneo us in order to prevent high peak current from the supply. non- overloaded channels continue to operate normally. the open-drain diagnostic outputs indicate overtemperature conditions and open load in the off-state. STEVAL-IFP010V3 www.st.com
schematic circuit STEVAL-IFP010V3 2/4 doc id 022631 rev 1 1 schematic circuit figure 1. schematic circuit c1 10nf c2 10nf c3 100nf + c4 47uf t2 t1 gnd out1 out2 +24vdc 1 2 m2 m.2viteb d1 sm15t39ac c5 4.7nf c6 4.7nf t3 t4 a b j3 gnd disc. test t5 t6 a b j4 vcc disc. test current probe a b j2 dl1 led dl2 led 1206 1206 1206 in1 in2 vdd stat1 stat2 in1 in2 vdd stat2 stat1 in1 in2 vdd stat2 stat1 or 12 34 56 7 8 910 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 j1 evalcommboard 12 3 4 5 6 7 8 910 11 12 13 14 j5 can7 1 2 m1 m.2viteb 1 2 4 3 ic2 tlp281f 1 2 4 3 ic3 tlp281f 1 2 4 3 ic4 tlp281f 1 2 4 3 ic5 tlp281f r3 47k r4 47k r9 10k r10 10k r7 10k r8 10k r5 1k r6 1k r1 22k r2 22k 1206 1206 1206 1206 1206 1206 1206 1206 r12 220k r11 220k 1206 1206 in 1 2 diag 1 3 diag 2 5 in 2 6 gnd 4 out 1 11 out 2 9 out 1 10 out 2 8 vcc tab vcc 7 vcc 12 ic1 vni2140j am045 3 18v1
STEVAL-IFP010V3 revision history doc id 022631 rev 1 3/4 2 revision history table 1. document revision history date revision changes 22-dec-2011 1 initial release.
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